Failure-model-driven repair and backup
US8140914B2 · kind B2 · utility
26Cited by
5References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 15, 2009 |
| Grant date | Mar 20, 2012 |
| Priority date | — |
| Expiry date | Jan 27, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/008
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A predictive failure model is used to generate a failure prediction associated with a node. A repair or backup action may also be determined to perform on the node based on the failure prediction.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.