Stamper and stamper evaluation method
US8142693B2 · kind B2 · utility
1Cited by
1References
3Claims
0Family size
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Key dates
| Filing date | Sep 29, 2009 |
| Grant date | Mar 27, 2012 |
| Priority date | — |
| Expiry date | May 11, 2030 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T428/21
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
According to one embodiment, letting Vf be a maximum voltage value level within the range of a frequency 60 to 170 times the rotational speed of a stamper and Vave be the average sum signal voltage value of a data recording portion in the sum signal of a voltage signal when the data recording portion is irradiated with a laser having a wavelength of 450 nm or less and an NA of 0.6 or more, whether Vf and Vave meet Vf/Vave<7.7×10−4 . . . (1) is determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.