Electrostatic latent image measuring device
US8143603B2 · kind B2 · utility
3Cited by
16References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 20, 2009 |
| Grant date | Mar 27, 2012 |
| Priority date | — |
| Expiry date | Jan 21, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03G15/5037
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
An electrostatic latent image measuring device includes a charged particle optical system which irradiates an electron beam and charges a photoconductor sample, an exposure optical system which forms an electrostatic latent image on a surface of the photoconductor sample, and a scanning unit which scans the surface of the photoconductor sample by the electron beam, a distribution of the electrostatic latent image on the surface of the sample being measured by a signal detected by the scanning.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.