Patent · US Active

Resonance scanning system and method for testing equipment for electromagnetic resonances

US8143903B2 · kind B2 · utility

2Cited by
1References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 1, 2009
Grant dateMar 27, 2012
Priority date
Expiry dateAug 7, 2030

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R29/0878
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A resonance scanning system and method for testing equipment for electromagnetic resonances uses a resonance detection subsystem with at least one probe to identify at least one of a resonating location, a resonating frequency and a quality factor of a resonance of the equipment and an automatic scanning subsystem to displace the probe to different testing locations of the equipment so that the resonance detection subsystem can determine if any of the different testing locations of the equipment exhibits electromagnetic resonances.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.