Spectral characteristic measuring apparatus, method for calibrating spectral characteristic measuring apparatus, and spectral characteristic measuring system
US8144322B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 1, 2009 |
| Grant date | Mar 27, 2012 |
| Priority date | — |
| Expiry date | Oct 9, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectral characteristic measuring apparatus includes: an illuminating section for irradiating illumination light onto a sample; a spectral section for separating light from the sample irradiated with the illumination light into light rays in accordance with wavelengths; a light receiving section including a plurality of light receiving elements for receiving the light rays separated by the spectral section in accordance with wavelengths, and converting the received light rays into electrical output signals; and a storing section for storing a combined central wavelength of each of the light receiving elements calculated in advance based a spectral intensity distribution of the illumination light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.