Extended input/output measurement word facility and emulation of that facility
US8145802B2 · kind B2 · utility
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47References
18Claims
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Key dates
| Filing date | Jan 12, 2011 |
| Grant date | Mar 27, 2012 |
| Priority date | — |
| Expiry date | Jan 12, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/88
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.