Automated regression failure management system
US8145949B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 16, 2010 |
| Grant date | Mar 27, 2012 |
| Priority date | — |
| Expiry date | Jul 16, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3688
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In a first embodiment of the present invention, a method for performing regression testing on a simulated hardware is provided, the method comprising: scanning a defect database for fixed signatures; retrieving all tests in a failing instance database that correspond to the fixed signatures from the defect database; running one or more of the retrieved tests; determining if any of the retrieved tests failed during running; and for any retrieved test that failed during running, refiling the failed retrieved tests in the failing instance database and placing one or more generalized signatures for the failed retrieved tests in the defect database.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.