Patent · US Active

Pick-and-place module for test handlers

US8146969B2 · kind B2 · utility

2Cited by
5References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 20, 2010
Grant dateApr 3, 2012
Priority date
Expiry dateMay 20, 2030

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2893
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A pick-and-place module for test handlers includes a main body, and a kit. The main body has N-th vacuum paths (where N is plural). The kit has M-th pickers. The M-th pickers are provided so as respectively correspond to M-th vacuum passages (where 1≦M≦N), which are formed to respectively correspond to all or some of the N-th vacuum paths formed in the main body, and holds semiconductor devices or releasing the held semiconductor devices using vacuum pressures. The kit is detachably mounted to the main body.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.