Patent · US Active

Process of positioning groups of contact structures

US8148646B2 · kind B2 · utility

8Cited by
14References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 29, 2008
Grant dateApr 3, 2012
Priority date
Expiry dateJun 24, 2030

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49149
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A contact apparatus can be made by providing a first substrate with electrically conductive terminals and second substrates each of which can have contact structures. Each of the contact structures can have a contact tip. The second substrates can be aligned such that contact tips of the contact structures are aligned substantially in a plane. An optical system can be used to monitor an actual position of the second substrates, and a mechanical system can be used to move the second substrates to aligned positions. The contact structures can be attached to ones of the terminals on the first substrate while the second substrates are in the aligned positions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.