Method and device for measuring the spectral phase or the combined spectral and spatial phases of ultra short light pulses
US8149414B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 29, 2008 |
| Grant date | Apr 3, 2012 |
| Priority date | — |
| Expiry date | Jun 16, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J11/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The method and device for measuring the spectral phase or combined spectral and spatial phases of ultra short light pulses, consisting of a decomposition of the light pulse to be measured in two identical replicas called signal pulse and primary reference pulse, respectively, of different polarization or direction and the phase characteristics of which are essentially identical to the original pulse, a temporal filtering of the primary reference pulse by a nonlinear interaction generating a secondary reference pulse of average frequency essentially identical and of spectral width greater than the spectral width of the primary reference pulse, and a spectral interferometry measurement by recombination of this secondary reference pulse and the signal pulse with a given temporal offset.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.