Optical reflectometry and optical reflectometer
US8149419B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 21, 2008 |
| Grant date | Apr 3, 2012 |
| Priority date | — |
| Expiry date | Apr 6, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/3172
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An object of the invention is to provide an optical reflectometry and an optical reflectometer, in which accurate measurement can be performed irrespective of a measurement distance. In the optical reflectometry and optical reflectometer according to the invention, in which a distribution of backscattered light intensity from a measurement target in an optical propagation direction is measured using Optical Frequency Domain Reflectometry (OFDR), a coherence monitor unit 12 that monitors a coherence property of a frequency sweep light source 1 is provided, and measurement result of a measuring unit 11 is corrected based on the monitor result of the coherence monitor unit 12.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.