Operating parameter monitor for an integrated circuit
US8154353B2 · kind B2 · utility
4Cited by
5References
21Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 3, 2009 |
| Grant date | Apr 10, 2012 |
| Priority date | — |
| Expiry date | Mar 11, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2884
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit 2 is provided with one or more monitoring circuits 14, 16, 18, 20 in the form of ring oscillators 22. These ring oscillators 22 include a plurality of tri-state inverters 24, 26, 28 containing a current-limiting transistor 42 operating in a leakage mode. The leakage current through the transistor 42 is dependent upon an operating parameter of the integrated circuit 2 being monitored. Accordingly, the oscillation frequency Fosc of the ring oscillator 22 varies in dependence upon the operating parameter to be measured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.