Detection of defective pixels in an image sensor
US8154632B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 24, 2009 |
| Grant date | Apr 10, 2012 |
| Priority date | — |
| Expiry date | Oct 13, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/683
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A system and method for detecting defective pixels in a sensor. A plurality of pixel values of the sensor may be detected. The values may include those of a first pixel and each nearest neighboring pixel to the first pixel. A second pixel may have the highest value of the neighboring pixels. A third pixel may have the next highest value of the neighboring pixels. A first function may be performed on the second pixel value, producing a first output value. A second function may be performed on the third pixel value, producing a second output value. If the first pixel value is higher than the first output value, or, if the first pixel value is higher than the second output value and the second pixel value is higher than the second output value, it may be determined that the first pixel is defective.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.