Optical analysis system and method for real time multivariate optical computing
US8154726B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 27, 2006 |
| Grant date | Apr 10, 2012 |
| Priority date | — |
| Expiry date | Jul 29, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/1293
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical analysis system and method for determining information carried by light include a multivariate optical element disposed in the system to receive a source light from an illumination source; filtering the source light through a spectral element in the optical element analysis system; reflecting the filtered light through an inner region of a cavity in a first direction of a sample to be measured, the cavity defining a second region disposed about the inner region; focusing the reflected light proximate the sample; reflecting the focused light from the sample through the second region in a second direction of a beamsplitter, the light being reflected from the sample carrying data from the sample; splitting the sample carrying light with the beamsplitter into a first light and a second light; optically filtering the data of the first light with the multivariate optical element into an orthogonal component; directing the first light filtered by the multivariate optical element onto a first photodetector; directing the second light onto a second photodetector; and comparing the orthogonal component to information present in the second light to determine a property of the sampl…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.