Method and a system for the assessment of samples
US8154731B2 · kind B2 · utility
5Cited by
13References
116Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 17, 2005 |
| Grant date | Apr 10, 2012 |
| Priority date | — |
| Expiry date | Nov 12, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/129
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention offers an alternative strategy for the correlation of interference information to chemical and/or physical properties of a sample. This strategy can be implemented in a method and a system, which offer substantial technical and commercial advantages over state of the art techniques based on interference spectroscopy. The invention further provides a method for standardizing an interferometer, as well as a method and a system using the standardized interferometer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.