Condensing a defect scan log for a disk of a disk drive
US8154812B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 5, 2011 |
| Grant date | Apr 10, 2012 |
| Priority date | — |
| Expiry date | Oct 5, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2220/2516
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The embodiments relate to optimizing a defect log of a storage device, such as a disk drive. The defect log may comprise entries for individual locations, such as sectors on a disk, and entries indicating zones. A zone comprises a plurality of locations in the medium of the storage device and may contain adjacent or non-adjacent defects. One or more medium of the storage device may be scanned for defects and locations of these defects are recorded in the defect log. The defect log may then be analyzed to determine if certain number of defects are in proximity to each other, adjacent or non-adjacent, within a zone. If the defects within a zone exceed a threshold, then the defect log may be condensed by coalescing the individual entries of the defects into zone entries. In addition, the defect log may be further condensed by coalescing zone entries of adjacent zones into combined entries.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.