Patent · US Active

Wave field microscope with sub-wavelength resolution and methods for processing microscopic images to detect objects with sub-wavelength dimensions

US8155409B2 · kind B2 · utility

1Cited by

3References

21Claims

0Family size

Assignee

RUPRECHT-KARLS-UNIVERSITAT · DE

Inventors

Christoph Cremer · Heidelberg, DE
David Baddeley · Heidelberg, DE
Jurgen Reymann · Heidelberg, DE
Udo Birk · Furtwangen, DE

Key dates

Filing date	Apr 17, 2008
Grant date	Apr 10, 2012
Priority date	—
Expiry date	Dec 12, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/10056
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

The invention relates to a computer implemented method for processing of microscopic images to detect objects of interest. The method includes subjecting the microscopic image to a bandpass filtering to obtain a filtered image, wherein the bandpass filtering is such as to suppress the noise and any objects which are larger than a predetermined size; and processing the filtered image at a plurality of progressively decreasing threshold levels. The processing at each threshold level includes detecting the objects of interest using an object labelling algorithm and removing the detected objects detected at a given threshold level from the working image before proceeding to the next threshold level.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.