Patent · US Active

Method and circuit arrangement for measuring a capacitance

US8155903B2 · kind B2 · utility

5Cited by
0References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 13, 2007
Grant dateApr 10, 2012
Priority date
Expiry dateApr 2, 2029

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01D5/24
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of measuring a capacitance, wherein a voltage across the capacitance is supplied to an input of an evaluation circuit that is designed so that it can detect input voltages with a predetermined degree of precision so long as these voltages are in a measurement interval, includes charging the capacitance to a predetermined starting voltage which exceeds a multiple of an upper limit of the measurement interval. The capacitance across a predetermined resistance is discharged for a predetermined time period. The voltage across the capacitance reaches a final voltage value which is dependent upon the amount of the capacitance. The resistance and the time interval are so chosen that the final voltage value lies in the measurement interval. The final voltage value is detected by the evaluation circuit and the capacitance is determined from the final voltage value. A circuit arrangement for measurement of a capacitance of a capacitor is also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.