Method and system for curve quality control
US8155906B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 26, 2003 |
| Grant date | Apr 10, 2012 |
| Priority date | — |
| Expiry date | Feb 3, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG16B20/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of analysis wherein molecular interactions at one or more sensing surface areas are detected and respective response curves representing the progress of each interaction with time are produced, and wherein a resulting set of response curves is subjected to a quality assessment procedure which comprises representing the response curves with one or more quality descriptors, applying a quality classification method to the descriptors to find outliers, and removing the outliers. The invention also relates to an analytical system including means for classifying the response curves with regard to quality, a computer program for performing the classification, and a computer program product containing the program.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.