Measuring tool
US8156657B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 25, 2010 |
| Grant date | Apr 17, 2012 |
| Priority date | — |
| Expiry date | Jun 1, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B3/14
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In one embodiment, a measuring tool includes a transparent sheet; a first pattern of markings on the transparent sheet for measuring characteristics of a test sheet; and a second pattern of markings on the transparent sheet for measuring characteristics of a target image printed on the test sheet. In another embodiment, a measuring tool includes a transparent substrate and a reference image on the transparent substrate. The reference image includes an alignment pattern for aligning the reference image, a first scale for measuring distances in a first direction, a second scale for measuring distances in a second direction perpendicular to the first direction, and a skew pattern for measuring perpendicularity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.