High dynamic range NDT/NDI inspection device with selective noise averaging
US8156813B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 3, 2009 |
| Grant date | Apr 17, 2012 |
| Priority date | — |
| Expiry date | Nov 11, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/1225
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for performing ultrasonic inspection of an object, during one measurement on the object, triggers a sequence of excitations of the probe system and receives a sequence of substantially identical echo signals reflected from the object, and further scales each echo signal to different degrees to increase and extend the dynamic range of the echo signals. An A/D converter is then used to digitize the scaled signal sequentially in a manner which dispenses the need for using numerous A/D converters and the associated filters. The digitized signal samples are then combined to produce a single digital output in a manner that is not over-flowed and with desirable resolution. A sequence of successive acquisitions of the scaled signal with the highest sensitivity are averaged to reduce system noise.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.