Patent · US Active

Method of fabricating semiconductor substrate by use of heterogeneous substrate and recycling heterogeneous substrate during fabrication thereof

US8163651B2 · kind B2 · utility

1Cited by
2References
7Claims
0Family size

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Key dates

Filing dateSep 12, 2008
Grant dateApr 24, 2012
Priority date
Expiry dateFeb 23, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02483
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The invention discloses a method of fabricating a first substrate and a method of recycling a second substrate during fabrication of the first substrate. The second substrate is heterogeneous for the first substrate. First, the fabricating method according to the invention is to prepare the second substrate. Subsequently, the fabricating method is to deposit a buffer layer on the second substrate. Then, the fabricating method is to deposit a semiconductor material layer on the buffer layer. The buffer layer assists the epitaxial growth of the semiconductor material layer, and serves as a lift-off layer. Finally, with an etching solution, the fabricating method is to only etch the lift-off layer to debond the second substrate away from the semiconductor material layer, where the semiconductor material layer serves as the first substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.