Magnetic field measurement method and magnetic sensor
US8164331B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 26, 2009 |
| Grant date | Apr 24, 2012 |
| Priority date | — |
| Expiry date | Aug 20, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/072
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The magnetic field measurement method has: a step of preparing a magnetic sensor which includes: a magneto-resistive effect element having a magnetization-free layer and a magnetization fixed layer, and having a longitudinal direction; and magnetic field application means, wherein the magnetization direction of the magnetization fixed layer is fixed in a direction which forms an angle equal to or less than 45 degrees to the longitudinal direction, and a magnetic field generated by the magnetic field application means forms an angle equal to or less than 45 degrees to the longitudinal direction; a step of saturating the magnetization of the magnetization-free layer by the magnetic field application means and magnetizing the magnetization-free layer in one direction in the longitudinal direction; and a step of measuring the strength of an external magnetic field by applying the external magnetic field to the magnetization-free layer in the other direction in the longitudinal direction.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.