Patent · US Active

Internal inspection system and method

US8164758B2 · kind B2 · utility

4Cited by

8References

20Claims

0Family size

Assignee

Quest Metrology, LLC · US

Inventors

Stanley P. Johnson · Simsbury, US
Phillip Dewayne Bondurant · Covington, US

Key dates

Filing date	Jul 10, 2009
Grant date	Apr 24, 2012
Priority date	—
Expiry date	Jul 29, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG01B11/2425
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In some embodiments, an inspection system for measuring at least a portion of the threaded surface of an internally threaded component includes at least one measuring probe, a component retention device that allows positioning of the internally threaded component relative to the measuring probe and a processing device in signal communication with the measuring probe to receive threaded surface data therefrom.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.