Hybrid defect detection for recording channels
US8164846B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 16, 2008 |
| Grant date | Apr 24, 2012 |
| Priority date | — |
| Expiry date | Jul 2, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2220/2516
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Methods, systems and computer program products for performing hybrid defect detection are disclosed. A hybrid defect detection mechanism may be used to detect various classes of defects (e.g., long and shallow defects, and short and deep defects) while reducing the probability of a miss or false alarm. In some implementations, the hybrid defect detection mechanism may utilize a defect detector that includes one or more defect sub-detectors. Each defect sub-detector may be associated with an individual threshold and sliding window length to enhance the hybrid defect detection process that maximizes the detection of a specific type or class of defects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.