Assessment of a view through the overlay of maps
US8165350B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 27, 2007 |
| Grant date | Apr 24, 2012 |
| Priority date | — |
| Expiry date | Feb 22, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q30/06
- WIPO fieldIT methods for management
- WIPO sectorElectrical engineering
Abstract
A system for evaluating a view, including a first mapper for encoding an image of a view according to a first parameter to create a first map having multiple defined areas, a second mapper for encoding the image according to a second parameter to create a second map having multiple defined areas, an overlap mapper for combining the maps to create an overlap map, a tabulator for measuring areas in the overlap map corresponding to overlapping defined areas, creating a set of measurements of the image, and an analyzer for analyzing the set of measurements of the image and a learning set of measurement groups with associated values to compute an estimated value associated with the image where the estimated value relates to the set of measurements of the image in the same manner that each value in the learning set relates to its associated measurement group.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.