Laser system calibration
US8165838B2 · kind B2 · utility
4Cited by
6References
33Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 2, 2008 |
| Grant date | Apr 24, 2012 |
| Priority date | — |
| Expiry date | Apr 11, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S3/1312
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Disclosed is a method to determine behavior characteristics of one or more modules of a laser system. The method includes applying inputs to the one or more modules of the laser system, measuring outputs resulting from the application of the inputs, and determining an equation-based mathematical relationship relating the inputs to the resultant outputs of the one or more modules of the laser system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.