Identifying patterns of significance in numeric arrays of data
US8166064B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 6, 2009 |
| Grant date | Apr 24, 2012 |
| Priority date | — |
| Expiry date | Apr 17, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2218/12
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is a computer method and system for identifying significance of patterns across a plurality of data patterns, which involves identifying pattern types of the plurality of data patterns, determining a relative pattern significance factor to compare the pattern types. Determining the relative pattern significance factor further involves calculating a percentage change of an identified outlier from a median for a outlier pattern, calculating a value of a step change as a percentage of a last value of a step preceding the step change for a step change pattern and calculating a percentage change from a start value on the fitted curve to an end value on the fitted curve for a trend pattern. A ranked list of the pattern types are returned based on their corresponding relative pattern significant factors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.