Image sensor ADC and CDS per column with oversampling
US8169517B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 16, 2007 |
| Grant date | May 1, 2012 |
| Priority date | — |
| Expiry date | Apr 6, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/56
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A solid state imager converts analog pixel values to digital form on an arrayed per-column basis. An N-bit counter supplies an N-bit DAC to produce an analog ramp output with a level that varies corresponding to the contents of the counter. A latch/counter or equivalent is associated with each respective column. A clock supplies clock signal(s) to the counter elements. When the analog ramp equals the pixel value for that column, the latch/counter latches the value. The black level can be pre-set in the latch/counter or can be subtracted separately to reduce fixed pattern noise. The pixels can be oversampled for some number of times, e.g., n=16, to reduce the thermal noise of the sensors. Also, two or more pixels sharing a common sense node may be binned together, and two (or more) pixels having different integration times may be combined to obtain an output signal with enhanced dynamic range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.