Surface mapping by optical manipulation of particles in relation to a functionalized surface
US8169600B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 14, 2007 |
| Grant date | May 1, 2012 |
| Priority date | — |
| Expiry date | Sep 21, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/80
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatus for analyzing surface properties of particles are provided. A method for analyzing the surface properties of the particle includes a associating a first particle with a first capture zone having a specific binding affinity for a first chemical species, applying an optical force to the first particle, sensing a response of the first particle to the optical force, and using the sensed response to determine the presence, absence or quantity of the first chemical species on the first particle surface. This process may be repeated in parallel to test multiple particles. In addition to directly testing the surface properties of the particles, the method can be used in direct, indirect and competitive assays to determine the presence, absence or quantity of free or immobilized analytes. A fluidic cartridge with capture zones having avidities that are tuned for the use of optical forces is provided. A software routine for performing the method is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.