Systems and methods that detect changes in incident optical radiation
US8174253B2 · kind B2 · utility
0Cited by
28References
33Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 22, 2011 |
| Grant date | May 8, 2012 |
| Priority date | — |
| Expiry date | Feb 22, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J5/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems, methods and sensors detect changes in incident optical radiation. Voltage is applied across one or more active areas of a detector while the incident optical radiation illuminates the active areas. Current is sensed across one or more of the active areas, a change in the current being indicative of the changes in incident optical radiation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.