Apparatus for inspecting defects of honeycomb structure
US8174689B2 · kind B2 · utility
3Cited by
0References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 13, 2009 |
| Grant date | May 8, 2012 |
| Priority date | — |
| Expiry date | Sep 10, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/0846
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to an apparatus for inspecting defects of a honeycomb structure that is provided with a current plate and an air current formation means (air source and a header tube), fine defects or defects taking place in the vicinity of an outer periphery of the honeycomb structure can be detected with high sensitivity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.