On-chip estimation of key-extraction parameters for physical tokens
US8176106B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 12, 2006 |
| Grant date | May 8, 2012 |
| Priority date | — |
| Expiry date | Sep 3, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L2209/26
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
The present invention relates to a method and a device (11) using a physical token (14), which provides measurable parameters, to derive at least one data set. A plurality of values of one or more of the parameters are measured. From these measured values, a measure of variance is calculated. Quantization intervals into which a measured value is to be quantized are then determined. A possible value of a data set, which subsequently can be derived from a measured value provided by the physical token, is associated with each quantization interval. Further, information which subsequently enables determination of these quantization intervals is stored. Hence, an enrolling phase has been completed. When the preparing phase has been completed, a deriving phase may commence. When a data set is to be derived, for example to be used as a cryptographic key, a value of any one of the parameters provided by the PUF is measured. This measured value is quantized into a determined quantization interval, and a data set may be derived from the quantization interval into which the measured value is quantized.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.