Ion detection and parameter estimation for N-dimensional data
US8178834B2 · kind B2 · utility
14Cited by
4References
22Claims
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Key dates
| Filing date | May 25, 2007 |
| Grant date | May 15, 2012 |
| Priority date | — |
| Expiry date | May 30, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG16C20/70
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Methods and apparatus for LC/IMS/MS analysis involve obtaining noisy raw data from a sample, convolving the data with an artifact-reducing filter, and locating, in retention-time, ion mobility, and mass-to-charge-ratio dimensions, one or more ion peaks of the convolved data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.