Method and system that determines the value of a resistor in linear and non-linear resistor sets
US8179151B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 22, 2008 |
| Grant date | May 15, 2012 |
| Priority date | — |
| Expiry date | Jan 15, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/205
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention employs identically sized mirror transistors arrange in groups that may be preferentially addressed and activated to determine the value of a resistor. Known current are directed through the resistor, and the voltage developed is measured by comparing against a reference voltage. The current is increased or decreased by the least significant value until the voltage across the resistor matches the reference voltage. A successive approximation or other known technique may be used instead. A reference current is developed that temperature stable and that is trimmed when manufactured to reduce process effects. The reference voltage may be constructed to be independent form a local power source so that the system is relatively independent of process, voltage and temperature, PVT.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.