Latency measurement in optical networks
US8180216B2 · kind B2 · utility
7Cited by
35References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 20, 2007 |
| Grant date | May 15, 2012 |
| Priority date | — |
| Expiry date | Nov 13, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L43/50
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A device for measuring optical latency in a test path includes an optical source to generate an optical signal. An optical modulator modulates the optical signal based on a modulation signal. An output port outputs the modulated optical signal to the test path. An input port receives a return optical signal following propagation through the test path. Latency calculating logic calculates the optical latency for the test path based on the modulation signal and the return optical signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.