Parametric data-based process monitoring for adaptive body bias control
US8181147B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 29, 2009 |
| Grant date | May 15, 2012 |
| Priority date | — |
| Expiry date | Jul 23, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C11/4074
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Various embodiments of systems and methods are disclosed for providing adaptive body bias control. One embodiment comprises a method for adaptive body bias control. One such method comprises: modeling parametric data associated with a chip design; modeling critical path data associated with the chip design; providing a chip according to the chip design; storing the parametric data and the critical path data in a memory on the chip; reading data from a parametric sensor on the chip; based on the data from the parametric sensor and the stored critical path and parametric data, determining an optimized bulk node voltage for reducing power consumption of the chip without causing a timing failure; and adjusting the bulk node voltage according to the optimized bulk node voltage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.