Eddy current testing device
US8183862B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 20, 2009 |
| Grant date | May 22, 2012 |
| Priority date | — |
| Expiry date | May 14, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/9046
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An eddy current testing device which confirms that a change in characteristics of a target object is detected regardless of the magnitude of the change and specifying the position of a portion from which the change is detected. The device uses an eddy current probe to inspect a bent portion of a metal body, and has an inspection controller and a display unit. The inspection controller calculates a phase angle of a signal detected by the eddy current probe and generates flaw identification image data that indicates an area (or an area of the signal detected and determined to correspond to a flaw signal, based on the phase angle of the detected signal) of a flaw signal in coordinates in which the position of the portion of the target object is plotted along a coordinate axis. The display unit displays the flaw identification image data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.