Fourier domain sensing
US8184279B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 16, 2009 |
| Grant date | May 22, 2012 |
| Priority date | — |
| Expiry date | Jul 3, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B27/0075
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods, systems, and apparatuses are provided for measuring one or more sinusoidal Fourier components of an object. A structured second radiation is generated by spatially modulating a first radiation. The structured second radiation illuminates the object, The structured second radiation is scaled and oriented relative to the object. The object produces a third radiation in response to the illuminating. A single-element detector detects a portion of the third radiation from multiple locations on the object substantially simultaneously for each spatial modulation of the first radiation and for each orientation of the second radiation. A time-varying signal is produced based on said detected portion of the third radiations. One or more characteristics of the one or more sinusoidal Fourier components of the object are estimated based on the time-varying signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.