Patent · US Active

Apparatus for measuring distortion power quality index and method of operating the apparatus

US8185358B2 · kind B2 · utility

1Cited by
3References
20Claims
0Family size

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Key dates

Filing dateNov 8, 2007
Grant dateMay 22, 2012
Priority date
Expiry dateJan 7, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R19/2513
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of measuring a power quality index. A total current waveform of an ingress from a customer, and a current waveform and a voltage waveform of each of at least one load installed at the customer are measured. A load composition (LC) of the customer using the total current waveform of the ingress and the current waveform of each of the at least one load is computed. A total harmonic distortion (THD) of each of the at least one load using the current waveform and the voltage waveform of each of the at least one load is computed. Thereafter, a distortion power quality index (DPQI) of each of the at least one load using the LC and the THD is computed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.