Patent · US Active

Surface evaluation employing orthogonal force measurement

US8186210B2 · kind B2 · utility

5Cited by
3References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 22, 2009
Grant dateMay 29, 2012
Priority date—
Expiry dateAug 27, 2030

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/0286
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for evaluating a performance of a substrate surface including applying a normal force with a probe to a surface of a substrate, the normal force being substantially perpendicular to the surface, and moving the probe across the surface to generate a force against and to scratch the surface, the force being substantially parallel to the surface and comprising a coaxial force along the scratch and an orthogonal force perpendicular to the scratch. The method further includes measuring a magnitude of the orthogonal force as the probe moves across the coating, and determining a fracture point of the surface by the probe based on changes in the magnitude of the orthogonal force.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.