Time domain spectroscopy (TDS)-based method and system for obtaining coincident sheet material parameters
US8187424B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 1, 2008 |
| Grant date | May 29, 2012 |
| Priority date | — |
| Expiry date | Jul 16, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/86
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An in-situ time domain spectroscopy (TDS)-based method (200) for non-contact characterization of properties of a sheet material while being produced by a manufacturing system (700). A time domain spectrometry system (100) and calibration data for the system is provided. The calibration data includes data for transmitted power through or reflected power from the sheet material as a function of a moisture content of the sheet material. At least one pulse of THz or near THz radiation from a transmitter (111) is directed at a location on a sheet material sample (130) while being processed by the manufacturing system (700). Transmitted or reflected radiation associated with at least one transmitted or reflected pulse from the sample location is synchronously detected by a detector (110) to obtain the sample data. The sample data, which is coincident data, is processed together with the calibration data (207, 208, 209) to determine at least one, and generally a plurality of properties of the sheet material sample (130) selected from caliper, basis weight and moisture content.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.