Planogram extraction based on image processing
US8189855B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 31, 2007 |
| Grant date | May 29, 2012 |
| Priority date | — |
| Expiry date | May 22, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V20/64
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Image analysis techniques, including object recognition analysis, are applied to images obtained by one or more image capture devices deployed within inventory environments. The object recognition analysis provides object recognition data (that may include one or more recognized product instances) based on stored product (training) images. In turn, a variety of functionalities may be enabled based on the object recognition data. For example, a planogram may be extracted and compared to a target planogram, or at least one product display parameter for a product can be determined and used to assess presence of the product within the inventory environment, or to determine compliance of display of the product with a promotional objective. In yet another embodiment, comparisons may be made within a single image or between multiple images over time to detect potential conditions requiring response. In this manner, efficiency and effectiveness of many previously manually-implemented tasks may be improved.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.