Method for assessing image quality
US8189911B2 · kind B2 · utility
1Cited by
1References
8Claims
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Key dates
| Filing date | Dec 19, 2008 |
| Grant date | May 29, 2012 |
| Priority date | — |
| Expiry date | May 30, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30168
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for assessing image quality between a reference image and an impaired image is disclosed. The method comprises the steps of The subband decomposition is based on a wavelet transform adapted to decompose each of the luminance components into L levels of decomposition, with L a positive integer determined as a function of the image height and of the distance of visualization.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.