Fault prediction method, fault prediction system, and image forming apparatus
US8190037B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 19, 2009 |
| Grant date | May 29, 2012 |
| Priority date | — |
| Expiry date | Oct 22, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03G2215/00109
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A fault prediction method predicts a plurality of faults in a target device, and includes the steps of collecting internal information of the target device output from the target device, generating one or more criteria for defining a deviation from a normal state based on the collected internal information of the target device, incorporating the one or more criteria into a device state discriminator, identifying a deviation from a normal state in the target device according to the one or more criteria using the device state discriminator, and outputting a fault prediction as a result of the identifying step to a user. One or more of the steps are performed by a processor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.