Heterojunction bipolar transistor device with electrostatic discharge ruggedness
US8193609B2 · kind B2 · utility
0Cited by
6References
12Claims
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Key dates
| Filing date | May 15, 2008 |
| Grant date | Jun 5, 2012 |
| Priority date | — |
| Expiry date | May 5, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D62/824
Abstract
A heterojunction bipolar transistor (HBT) device and system having electrostatic discharge ruggedness, and methods for making the same, are disclosed. An HBT device having electrostatic discharge ruggedness may include one or more emitter fingers including an emitter layer, a transition layer formed over the emitter layer, and an emitter cap layer formed over the transition layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.