System and methods for controlling properties of nanojunction devices
US8196218B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 30, 2009 |
| Grant date | Jun 5, 2012 |
| Priority date | — |
| Expiry date | Sep 16, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01Q60/40
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An exemplary, highly integrated, SPM-based system for measuring the conductivity and/or force of substance under programmable engaging/stretching processes is described. A sample bias is applied across two electrodes. A substance to be measured is sandwiched between them. A first electrode is first brought relative to a second electrode (engaging) in programmable pathways that can be described as stretching distance versus time curves. The process of engaging the electrodes continues until a certain current reached, a certain force reached and whichever case happens first. The electrodes are then separated (stretching) in programmable pathways that can be described as stretching distance versus time curves. A periodic modulation can be applied to the engaging/stretching process to realize different stretch pathways. The sample bias across the electrodes is kept constant or swept in a programmable shape over time, described as a voltage-versus time curve. The conductivity, engaging/stretching distance, and/or force are measured simultaneously.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.