Method and system for determining the distance between a profiled surface and a functional surface moving in relation thereto by using measurement coils and a reference coil

US8198888B2 · kind B2 · utility

Assignees

• Siemens Aktiengesellschaft · DE
• MICRO-EPSILON-MESSTECHNIK GMBH & CO. KG · DE

Inventors

• Werner Grommer · Ortenburg, DE
• Felix Mednikov · Ortenburg, DE
• Robert Schmid · Fairview Avenue, DE
• Martin Sellen · Dordrecht, NL
• Benno Weis · Hemhofen, DE

Key dates

• Filing date: Sep 29, 2005
• Grant date: Jun 12, 2012
• Expiry date: Feb 21, 2028

Classification

• Technology area (CPC G): Physics
• CPC primary: G01B7/14
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

In one embodiment, a method for determining the distance of a conducting surface profiled in a direction of distance determination from a functional surface moving relative to the profiled surface is disclosed. The method includes connecting inputs of a sensor to an oscillator arrangement. The sensor includes a first and a second measuring coil. The method includes further connecting outputs of the sensor to an analog-to-digital converter via a demodulator unit to obtain first and second digital measured values. The first and second digital measured values correspond to the distance between the profiled surface and the first and second measuring coil of the sensor, respectively. The method further includes connecting an arithmetic unit to the analog converter unit. The second measurement coil is arranged at a known distance from the first measuring coil on the side of the first measuring coil that faces away from the profiled surface. The method finally includes calculating, using the first and second digital measured value and a reference digital value and the fixed distance, a distance measured value giving the distance of the functional surface from the profiled surface. The ref…