Patent · US Active

Systems and methods for monitoring catalyst device integrity

US8201443B2 · kind B2 · utility

5Cited by
6References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 28, 2008
Grant dateJun 19, 2012
Priority date
Expiry dateAug 4, 2029

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02T10/40
  • WIPO fieldEnvironmental technology
  • WIPO sectorChemistry

Abstract

Systems and methods for monitoring catalyst presence, reverse and damage in an aftertreatment device. The disclosed systems and methods involve calculating the heat capacity of the catalyst device based on information received from sensors for measuring temperatures at the inlet and outlet of the SCR device and the exhaust mass flow.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.