Spatial frequency optical measurement instrument and method
US8208144B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 15, 2008 |
| Grant date | Jun 26, 2012 |
| Priority date | — |
| Expiry date | Feb 23, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/51
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spatial frequency optical measurement instrument (100) is provided according to the invention. The instrument (100) includes a spatial frequency mask (120) positioned in a light path and configured to encode light with spatial frequency information, a light receiver (140) positioned to receive the light encoded with the spatial frequency information, wherein the light encoded with the spatial frequency information has been interacted with a sample material, and a processing system (180) coupled to the light receiver (140) and configured to determine a change in the spatial frequency information due to the interaction of the light with the sample material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.